目錄:賽默飛世爾科技（中國）有限公司>>透射電子顯微鏡（TEM）>> 能譜透射電鏡 Talos F200S TEM
| 價(jià)格區(qū)間 | 面議 | 儀器種類 | 熱場發(fā)射 |
|---|---|---|---|
| 應(yīng)用領(lǐng)域 | 環(huán)保,化工 |
能譜透射電鏡 Talos F200S TEM
能譜透射電鏡 Talos F200S TEM TEM microscope for high productivity, high resolution TEM and STEM characterization with chemical quantification
The Thermo Scientific Talos F200S (S)TEM is a (scanning) transmission electron microscope that combines outstanding high-resolution STEM and TEM imaging with industry-leading energy dispersive X-ray spectroscopy (EDS). The Talos F200S (S)TEM features great versatility and high through in STEM imaging and allows for precise EDS analysis and high-resolution TEM (HRTEM) for dynamic microscopy.
The Thermo Scientific Talos F200S 200kV (S)TEM combines fast, multichannel, high-resolution (S)TEM imaging and precise compositional analysis to enable dynamic microscopy applications. With innovative features designed to increase throughput, precision, and ease of use, the Talos (S)TEM is ideal for advanced research and analysis across academic, government, and industrial research environments.
Intuitive software
Features Thermo Scientific Velox Software for fast and easy acquisition and analysis of multimodal data.
Can be field upgraded to the Thermo Scientific Talos F200X (S)TEM.
Rapid, precise, quantitative EDS analysis using two in-column Thermo Scientific SDD Super-X Detectors with unique cleanliness, revealing nanoscale details.
Reduced environmental sensitivity thanks to the instrument enclosure, which moderates the impact of air pressure waves, air flows, and fine temperature variations in the TEM room.
High-throughput (S)TEM imaging with simultaneous, multiple signal detection delivers better contrast for high quality images.
Add application-specific in situ sample holders for dynamic experiments.
Specifications
| HRTEM line resolution |
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| HRSTEM [nm] |
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| Total beam current FEG |
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| EDS system |
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| EDS energy resolution |
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| Fast EDS mapping |
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| EDS Net solid angle |
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